X-ray studies of low-dose, high energy implanted silicon

J.G.E. Klappe, I. Barsony, J. Middelhoek, Hans Wallinga

    Research output: Contribution to conferencePosterOther research output

    Original languageEnglish
    Pages-
    Publication statusPublished - 29 Nov 1990
    EventFOM Werkgemeenschap Halfgeleiders 1990 - Veldhoven, Netherlands
    Duration: 28 Nov 199029 Nov 1990

    Conference

    ConferenceFOM Werkgemeenschap Halfgeleiders 1990
    CountryNetherlands
    CityVeldhoven
    Period28/11/9029/11/90

    Keywords

    • METIS-117183

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