X-ray multilayer supermirrors for the energy range up to 22 KeV have been theoretically studied and experimentally measured with synchrotron radiation. A multilayer mirror with 50 W/Si bi-layers of different thicknesses on an Si substrate has a smooth reflectivity of up to 32% in the whole energy range from 5 KeV to 22 KeV at a grazing incidence angle of 0.32 degrees.
|Title of host publication||Proceedings of SPIE - The International Society for Optical Engineering|
|Number of pages||4|
|Publication status||Published - 1 Dec 1995|
|Event||X-Ray Microbeam Technology and Applications 1995 - San Diego, United States|
Duration: 11 Jul 1995 → 12 Jul 1995
|Conference||X-Ray Microbeam Technology and Applications 1995|
|Period||11/07/95 → 12/07/95|