XRD study of the properties of epitaxial PbZrxTi(1-x)O3 thin films

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 7 Oct 2015
Event22nd International Workshop on Oxide Electronics, iWOE 2015 - Paris, France
Duration: 7 Oct 20159 Oct 2015
Conference number: 22

Conference

Conference22nd International Workshop on Oxide Electronics, iWOE 2015
Abbreviated titleiWOE
CountryFrance
CityParis
Period7/10/159/10/15

Keywords

  • METIS-313017

Cite this

Vergeer, K., Houwman, E. P., Koster, G., & Rijnders, A. J. H. M. (2015). XRD study of the properties of epitaxial PbZrxTi(1-x)O3 thin films. -. Poster session presented at 22nd International Workshop on Oxide Electronics, iWOE 2015, Paris, France.