Zapping thin film transistors

N. Golo-Tosic, F.G. Kuper, A.J. Mouthaan

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)747-765
    JournalMicroelectronics reliability
    Volume42
    Publication statusPublished - 2002

    Keywords

    • METIS-211677

    Cite this

    Golo-Tosic, N., Kuper, F. G., & Mouthaan, A. J. (2002). Zapping thin film transistors. Microelectronics reliability, 42, 747-765.
    Golo-Tosic, N. ; Kuper, F.G. ; Mouthaan, A.J. / Zapping thin film transistors. In: Microelectronics reliability. 2002 ; Vol. 42. pp. 747-765.
    @article{918b0f69ca784707b7b6db41bed40057,
    title = "Zapping thin film transistors",
    keywords = "METIS-211677",
    author = "N. Golo-Tosic and F.G. Kuper and A.J. Mouthaan",
    year = "2002",
    language = "Undefined",
    volume = "42",
    pages = "747--765",
    journal = "Microelectronics reliability",
    issn = "0026-2714",
    publisher = "Elsevier",

    }

    Golo-Tosic, N, Kuper, FG & Mouthaan, AJ 2002, 'Zapping thin film transistors', Microelectronics reliability, vol. 42, pp. 747-765.

    Zapping thin film transistors. / Golo-Tosic, N.; Kuper, F.G.; Mouthaan, A.J.

    In: Microelectronics reliability, Vol. 42, 2002, p. 747-765.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Zapping thin film transistors

    AU - Golo-Tosic, N.

    AU - Kuper, F.G.

    AU - Mouthaan, A.J.

    PY - 2002

    Y1 - 2002

    KW - METIS-211677

    M3 - Article

    VL - 42

    SP - 747

    EP - 765

    JO - Microelectronics reliability

    JF - Microelectronics reliability

    SN - 0026-2714

    ER -

    Golo-Tosic N, Kuper FG, Mouthaan AJ. Zapping thin film transistors. Microelectronics reliability. 2002;42:747-765.